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XRF Karat Testing by CREDIT TMK

อัปเดตเมื่อ 16 ก.ย.

As the value of jewelry is essentially a weight of pure gold, it can be exchanged or sold in the future as easily as it was purchased. We offers trading service, which allows you to sell or exchange your jewelry at the daily precious metal current value. (excluded premium design and labor cost).















Unlock the value of your gold items! 🔑✨ We offer quick and secure transactions. Contact us now to get your free assessment! Get paid faster than you think! 💸 #GoldInvestment #QuickCash #GoldSelling

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XRF Karat Testing by CREDIT TMK

X-Ray Fluorescence (XRF) based karat tester designed for rapid, non-destructive analysis of precious metals including gold, silver, platinum, and palladium.


This technology is recognized internationally for hallmarking precious metals due to its accuracy, safety, and efficiency


Key Specifications & Features:

  • Analysis range: From low parts-per-million (ppm) to 100% purity 

  • Precision: RSD (Relative Standard Deviation) ≤ 0.05% for samples where Ag ≥ 90% 

  • Elements detected: Precious metals such as Au, Ag, Pt, Pd, Ru, Rh, Ir, Os; plus base metals including Cr, Mn, Fe, Co, Ni, Cu, Zn, Cd, Sn, Pb 

  • Sample types supported: Solid, powder, and liquid forms 


Technical & Environmental Specs:

  • Operating conditions: Ambient temperature 10–35 °C; relative humidity 35–70% 

  • Physical dimensions & weight: Approximately 414 × 416 × 362 mm; net weight around 28 kg 

  • Power requirement: AC 220 V ± 5 V, 50/60 Hz 


Performance & Hardware:

  • X-ray tube voltage: 5–50 kV; current up to 1000 μA (optical pipe flow 0–1000 μA) 

  • Multichannel analyzer: JPSpec-DPP with 4096 channels; detector type is Si‑pin 

  • Test duration: 30–100 seconds per sample 

  • Sample chamber dimensions: Approximately 307 × 268 × 97 mm 

  • Software: FP qualitative and quantitative analysis software


How It Works: XRF Karat Meters


XRF (X‑Ray Fluorescence) analyzers operate by irradiating a sample with X-rays, causing characteristic secondary X-rays to be emitted. Each element’s unique emission fingerprint allows for precise identification and quantification. The method is fast (often under a minute), non-destructive, and handles various sample forms (solid, powder, liquid) with minimal preparation


Feature

Specification

Analysis Range

ppm to 100%

Precision (for Ag ≥ 90%)

RSD ≤ 0.05%

Elements Detected

Au, Ag, Pt, Pd, Ru, Rh, Ir, Os + multiple base metals

Sample Types

Solid, powder, liquid

Test Time

30–100 seconds

Size & Weight

~414 × 416 × 362 mm; ~28 kg

Detector & Analyzer

Si-pin detector; JPSpec-DPP (4096 channels)

Applications

Jewelers, refiners, recyclers, quality inspection, pawnshops

Methodology

Non-destructive XRF analysis





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